English: Typical configuration of AFM.

As shown in the figure above, AFM typically consists of the following features.;

Cantilever (1) : Small spring-like cantilever (1) is supported on the support (2) by means of a piezoelectric element (3) so as to oscillate the cantilever (1) at its eigen frequency ; Sharp tip (4) which is fixed to open end of a cantilever (1) . Detector (5) configured to detect the deflection and motion of the cantilever (1) . Sample (6) will be measure by AFM are mounted on Sample stage (8). xyz-drive (7) which permits a sample (6) and Sample stage (8) to be displaced in x, y, and z directions with respect to a tip apex(4) Controllers and plotter (not shown).

Here, numbers surrounded by parentheses like "(1)" are sign to indicate feature (see Fig.3.). Datum coordination system (0) is intended to indicates the x-y-z direction.